. 5 1 59 7.2% 14150 ŷǰ ִ. 4 21 52 Ű 15600 ϸ 10% Ȳ̴.
3б ȸ Ƽ ȴ. ü ǻ ֱ 3 3б ġ() 167, 32̴. ̴ б 43%, 100% ̴. 780 31%, 194 74% δ.
ߴ Z ݵü ι ȸ ̶ м̴. Zڰ (FinFET) ȭϰ ֱ ̴. ݵü 迡 Zڴ ũ ȴ. 14 ι ŭ ݵü Ź о 1 븸 TSMC ռ ̶ ´. Zڴ 14 ǰ ϰ, 30% ر ø ȹ̴.
28 Ÿ ű Ʈ ø̼ μ(AP) Ŀ帮 Zڿ ٽ Ź ̰, Z ȭ ο 巡 Ź ˷.
Ʈ ̿ ٿ ̸, 10 ̼ ʼ . 20 ǰ ִ 35% Һ ٰ ɵ 20% ȴ. ݵü ִ 15% ־ ϱ ´.
ݵü Ʈ ϰ ִ. ¿ Ʈ ǽ ҷǰ ϴ Ʈ(Wafer Test) (Ű¡) Ϸ Ĩ Ʈ ǽϴ ŰƮ(PKG Test) ̴ַ. ݱ Ʈ 93% е̴.
Ʈ ϴ ݵü SoC(System on Chip), CIS(CMOS Image Sensor), Smart Card IC, MCU(Micro Controller Unit) 4 . , PC Ǵ SoC Ʈ ̴. SoC Ʈ Z ý LSI AP κ ϰ ִ. Zڰ AP ι ȣȲ ̸ ɼ .
ֱ 4б ջ ݿ ְ(PER) 32.8. ְڻ(PBR) 1.48, ڱںͷ(ROE) 4.5%.
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