ù ְø ¼. 25 1 7 ̴ 1.8%(150) 8120 ŷǰ ִ.
ڰÿ ̴ ߱ þȿ ġ Z ߱(Samsung (China) Semiconductor Co.,Ltd) 25(2014 1.9%) Ը ݵü ˻(BURN IN TESTER) ް üߴٰ ǥߴ. Ⱓ 23Ϻ 31ϱ.
̷ ̴ ǥߴ. 1340 25.4% ߴ. 88 25.6%, 30 20% þ. 2013 ִ ߴ.
ݵü ι ̲ δ. 3б ݵü ˻ 747 2013 ݵü 607 پѾ. 3б ü 991 2013 1076 ߴ.
ݵü ڱ þ Ǯ̵ȴ. Z ݵüι б þ 2013 28.9% 88670 ߴ. ̷ ݵü ֵ þ ؼȴ. ڰÿ ̴ Zڷκ 9 ø ´. ̴ 2013 3 þ ġ.
̴ ݵü İ Ǵ (Test Burn-In Tester, Monitoring Burn-In Tester, Wafer Burn-In Tester) ַ Ѵ. ʹ ݵü , µ ϴ ݵü ҷθ Ѵ. ʹ Ҹ ǰ ݵü 귮 Բ 뷮 þ.
ص ȴ. ݵü ü 귮 ̱ ̴. к Zڴ ݵüι 15 ȹ̴. ̴ 143000 ݾ̴. SK̴н ؿ 52000 ̴.
ݿ ְ(PER) 84.3. ְڻ(PBR) 2.22, ڱںͷ(ROE) 2.6%.
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